X-ray diffuse scattering measurements of nucleation dynamics at femtosecond resolution.

نویسندگان

  • A M Lindenberg
  • S Engemann
  • K J Gaffney
  • K Sokolowski-Tinten
  • J Larsson
  • P B Hillyard
  • D A Reis
  • D M Fritz
  • J Arthur
  • R A Akre
  • M J George
  • A Deb
  • P H Bucksbaum
  • J Hajdu
  • D A Meyer
  • M Nicoul
  • C Blome
  • Th Tschentscher
  • A L Cavalieri
  • R W Falcone
  • S H Lee
  • R Pahl
  • J Rudati
  • P H Fuoss
  • A J Nelson
  • P Krejcik
  • D P Siddons
  • P Lorazo
  • J B Hastings
چکیده

Femtosecond time-resolved small and wide angle x-ray diffuse scattering techniques are applied to investigate the ultrafast nucleation processes that occur during the ablation process in semiconducting materials. Following intense optical excitation, a transient liquid state of high compressibility characterized by large-amplitude density fluctuations is observed and the buildup of these fluctuations is measured in real time. Small-angle scattering measurements reveal snapshots of the spontaneous nucleation of nanoscale voids within a metastable liquid and support theoretical predictions of the ablation process.

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عنوان ژورنال:
  • Physical review letters

دوره 100 13  شماره 

صفحات  -

تاریخ انتشار 2008